Inspection system for manufactured components

ABSTRACT

An inspection system includes a base plate, an array of fixtures, a plurality of light sources, and a drive mechanism. Each fixture has a first portion rotatably secured to the base plate and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base plate. The drive mechanism is configured to rotate the first portions of each fixture about each respective yaw axis and to rotate the second portions of each fixture about each respective pitch axis to adjust yaw and pitch angles of each light source, respectively.

TECHNICAL FIELD

The present disclosure relates to inspection systems for manufacturedproducts or components.

BACKGROUND

Inspection systems may be utilized to detect defects in manufacturedproducts during production of such manufactured products.

SUMMARY

An inspection system includes a base plate, an array of fixtures, aplurality of light sources, and a drive mechanism. The array of fixturesis arranged radially about a center of the base plate. Each fixture hasa first portion rotatably secured to the base plate and configured torotate about a yaw axis and a second portion rotatably secured to thefirst portion and configured to rotate about a pitch axis. Each lightsource is secured to one of the fixtures and is configured to directlight at a yaw angle about the yaw axis of the respective fixturerelative to a center of the base plate and away from the base plate at apitch angle about the pitch axis of the respective fixture relative toan outer surface of the base plate. The drive mechanism is configured torotate the first portions of each fixture about each respective yaw axisto adjust the yaw angle at which each light source directs lightrelative to the center of the base plate and to rotate the secondportions of each fixture about each respective pitch axis to adjust thepitch angle at which each light source directs light away from the baseplate relative to the outer surface of the base plate.

An inspection system for manufactured components includes a ring-shapedbase plate, an array of fixtures, a plurality of light sources, and adrive mechanism. The ring-shaped base plate defines a central openingand a plurality of orifices arranged radially about the central opening.Each fixture has a lower portion and an upper portion. The lower portionof each fixture has a first pivot shaft disposed within one orifice ofthe plurality of orifices such that the lower portion of each fixture isconfigured to rotate about a yaw axis. The upper portion of each fixtureis rotatably secured to the lower portion via a second pivot shaft suchthat the lower portion rotates about a pitch axis. Each light source issecured to one of the fixtures and is configured to direct light at ayaw angle about the yaw axis of the respective fixture relative to thecentral opening and away from the ring-shaped base plate at a pitchangle about the pitch axis of the respective fixture relative to anupper surface of the ring-shaped base plate. The drive mechanism isconfigured to rotate the lower portions of each fixture about eachrespective yaw axis to adjust the yaw angle at which each light sourcedirects light relative to the central opening, and to rotate the upperportions of each fixture about each respective pitch axis to adjust thepitch angle at which each light source directs light away from thering-shaped base plate relative to the upper surface of the ring-shapedbase plate.

An inspection system includes a base plate, a first array of fixtures, asecond array of fixtures, a plurality of light sources, a plurality ofcameras, and a drive mechanism. The first and second arrays of fixturesare interleaved relative to each other and are arranged radially about acenter of the base plate. Each fixture of the first and second arrays offixtures has a first portion rotatably secured to the base plate andconfigured to rotate about a yaw axis. Each fixture of the first andsecond arrays of fixtures has a second portion rotatably secured to thefirst portion and configured to rotate about a pitch axis. Each lightsource is secured to one of the fixtures of the first array of fixturesand is configured to direct light at a first yaw angle about the yawaxis of the respective fixture relative to a center of the base plateand away from the base plate at a first pitch angle about the pitch axisof the respective fixture relative to an outer surface of the baseplate. Each camera is secured to one of the fixtures of the second arrayof fixtures and is directed at a second yaw angle about the yaw axis ofthe respective fixture relative to the center of the base plate and awayfrom the base plate at a second pitch angle about the pitch axis of therespective fixture relative to the outer surface of the base plate. Thedrive mechanism is configured to rotate the first portions of eachfixture of the first array of fixtures about each respective yaw axis toadjust the first yaw angle at which each light source directs lightrelative to the center of the base plate, rotate the second portions ofeach fixture of the first array of fixtures about each respective pitchaxis to adjust the first pitch angle at which each light source directslight away from the base plate relative to the outer surface of the baseplate, rotate the first portions of each fixture of the second array offixtures about each respective yaw axis to adjust the second yaw angleat which each camera is directed relative to the center of the baseplate, and rotate the second portions of each fixture of the secondarray of fixtures about each respective pitch axis to adjust the secondpitch angle at which each camera is directed away from the base platerelative to the outer surface of the base plate.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is an isometric view of an inspection system for manufacturedproducts or components;

FIG. 2 is a top view of the inspection system for manufactured productsor components;

FIG. 3 is a side view of the inspection system for manufactured productsor components;

FIG. 4 is a top view of a base plate of the inspection system formanufactured products or components;

FIG. 5 is an isometric view of a fixture of the inspection system formanufactured products or components;

FIG. 6 is a side view of the fixture and a mechanism for adjusting thepitch angle of the fixture of the inspection system for manufacturedproducts or components;

FIG. 7 is an isometric view of the fixture illustrating a wiring systemutilized by the inspection system for manufactured products orcomponents; and

FIG. 8 is an isometric view of an alternative embodiment of theinspection system for manufactured products or components.

DETAILED DESCRIPTION

Embodiments of the present disclosure are described herein. It is to beunderstood, however, that the disclosed embodiments are merely examplesand other embodiments may take various and alternative forms. Thefigures are not necessarily to scale; some features could be exaggeratedor minimized to show details of particular components. Therefore,specific structural and functional details disclosed herein are not tobe interpreted as limiting, but merely as a representative basis forteaching one skilled in the art to variously employ the embodiments. Asthose of ordinary skill in the art will understand, various featuresillustrated and described with reference to any one of the figures maybe combined with features illustrated in one or more other figures toproduce embodiments that are not explicitly illustrated or described.The combinations of features illustrated provide representativeembodiments for typical applications. Various combinations andmodifications of the features consistent with the teachings of thisdisclosure, however, could be desired for particular applications orimplementations.

Referring to FIGS. 1-6, an inspection system 10 for manufacturedproducts or components is illustrated. The inspection system 10 isconfigured to inspect any manufactured component or product, includingbut not limited to, threaded bolts, rivets, nails, bottles, ammunitioncartridges, or any other manufactured product. The inspection system 10includes a plurality of light sources that are configured to illuminatea manufactured component or product and cameras that are configured todetect defects on the manufactured component or product. The positionsof the light sources are configured to transition during the inspectionin order to illuminate the manufactured component or product from arange of angles. More specifically, yaw and/or pitch angles at which thelight sources direct light toward the manufactured component or productmay perform a sweep over a range of yaw and/or pitch angles whileinspecting the manufactured component or product in order to ensure thatall defects are illuminated during the inspection process. Some defectsmay remain hidden if the light sources were to remain static and onlyoriented at single yaw and/or pitch angles during the inspectionprocess. Therefore, performing a sweep of angles at which the lightsources illuminate the manufactured component or product increases theprobability that all defects will be exposed during the inspectionprocess.

Defects may include any deviation beyond a tolerance from a desireddimension, geometry, or profile or any other defect of a manufacturedcomponent or product. For example, if the inspection station is beingutilized to inspect ammunition cartridges, the defects may include anydefect listed in military standard MIL-STD-636. Such defects include butare limited to, dents, splits, perforations, cracks, scratches,wrinkles, buckles, smudges, surface blemishes, etc. As another example,if the inspection station is being utilized to inspect threaded bolts,the defect may include a deviation from a desired threading geometry, adeviation in the diameter of the bolt head from a desired diameter, anyother deviation of a dimension, geometry, or profile that is greaterthan a tolerance, or any defect described immediately above (i.e.,dents, splits, perforations, cracks, scratches, wrinkles, buckles,smudges, surface blemishes, etc.). If the inspection station is beingutilized to inspect any other manufactured products or components (e.g.,a bottle, nail, rivet, etc.) the defect may include any deviation of adimension, geometry, or profile that is greater than a tolerance or anyof the defects described immediately above (i.e., dents, splits,perforations, cracks, scratches, wrinkles, buckles, smudges, surfaceblemishes, etc.).

The inspection system 10 includes a base plate 12. Please note the baseplate 12 is shown as a cross-section in FIG. 5 for illustrativepurposes. The base plate 12 may be a ring-shaped base plate that definesa central opening 14 and a plurality of orifices 16 that arrangedradially about the central opening 14. The inspection system 10 includesan array of fixtures 18 that are arranged radially about a center 19 ofthe base plate 12 or radially about the central opening 14 defined bythe base plate 12. Each fixture 18 has a first portion 20 that isrotatably secured to the base plate 12. The first portion 20 may also bereferred to as the lower portion. The first portion 20 of each fixture18 is configured to rotate about a yaw axis 22. More specifically, thefirst portion 20 of each fixture 18 may have a first pivot shaft 24 thatis disposed and configured to rotate within one orifice 16 of theplurality of orifices defined by the base plate 12 such that the firstportion 20 of each fixture 18 is configured to rotate about a respectiveyaw axis 22. Each yaw axis 22 that each respective first portion 20 ofeach fixture 18 is configured to rotate about may be substantiallyperpendicular to an outer or upper surface 26 of the base plate 12.Substantially perpendicular may refer to any incremental value betweenexactly perpendicular and 10° from exactly perpendicular.

Each fixture 18 has a second portion 28 that is rotatably secured to thefirst portion 20. The second portion 28 may also be referred to as theupper portion. The second portion 28 of each fixture 18 is configured torotate about a pitch axis 30 relative to the first portion 20 andrelative to the outer or upper surface 26 of the base plate 12. Morespecifically, the second portion 28 of each fixture 18 may be secured toa respective first portion 20 via a second pivot shaft 32 such that thesecond portion 28 of each fixture 18 is configured to rotate about arespective pitch axis 30. Each pitch axis 30 that each respective secondportion 28 of each fixture 18 is configured to rotate about may besubstantially parallel to the outer or upper surface 26 of the baseplate 12. Substantially parallel may refer to any incremental valuebetween exactly parallel and 10° from exactly parallel.

The inspection system 10 includes a plurality of light sources 34. Eachlight source 34 is secured to one of the fixtures 18 of the array offixtures. Each light source 24 is configured to direct light at a yawangle, ψ, about the yaw axis 22 of the respective fixture 18 that aspecific light source 34 is secured to relative to the center 19 of thebase plate 18. The exact center 19 or center point of the base plate 18may be positioned in the central opening 14. Each light source 24 isconfigured to direct light away from the base plate 18 at a pitch angle,θ, about the pitch axis 30 of the respective fixture 18 that a specificlight source 34 is secured relative to the outer or upper surface 26 ofthe base plate 12. The light sources 34 may be any type of light source,including but not limited to, a red light source, a blue light source, agreen light source, an infrared light source, an ultraviolet lightsource, or any combination thereof. The light sources maybe lightemitting diodes (LEDs), lasers, incandescent lights, or any other typeof light known in the art.

The inspection system 10 includes a drive mechanism that is configuredto adjust the positions the first portions 20 and the second portions 28of each fixture to adjust the yaw angles, ψ, and the pitch angles, θ, atwhich each of the light sources 34 is directed. The drive mechanism isconfigured to rotate the first portions 20 of each fixture 18 about eachrespective yaw axis 22 to adjust the yaw angles, ψ, at which each lightsource 34 directs light relative to the center 19 or relative to thecentral opening 14 of the base plate 18. The drive mechanism is alsoconfigured to rotate the second portions 28 of each fixture 18 abouteach respective pitch axis 30 to adjust the pitch angles, θ, at whicheach light source 34 directs light away from the base plate 12 relativeto the outer or upper surface 26 of the base plate 12.

The first portion 20 of each fixture 18 includes a protrusion 36 thatextends outward from the base plate 12. The drive mechanism isconfigured to engage the protrusions 36 of each fixture 18 to rotate thefirst portions 20 of each fixture about each respective yaw axis 22 toadjust each respective yaw angle, ψ, that each light source 34 directslight relative to the center 19 or relative to the central opening 14 ofthe base plate 18. More specifically, the drive mechanism includes anouter ring plate 38 that is disposed about the base plate 12 radiallyoutward of each of the fixtures 18. The outer ring plate 38 includesoutwardly or upwardly extending posts 40. Pairs of the posts 40 definesslots and the protrusions 36 of the first portions 20 of each fixture 18extend outward and into a slot that is defined between one of the pairsof the posts 40. Upon rotation of the outer ring plate 38 about thecenter 19 of the base plate 12, and along an axis that may besubstantially parallel with the yaw axes 22 that the first portions 20of the fixtures 18 are configure to rotate about, the posts 40 areconfigured to engage each protrusion 36 to rotate the first portions 20of each fixture 18 about each respective yaw axis 22.

The outer ring plate 38 may include gear teeth 42. An actuator 44, suchas a servo motor, may be secured to the base plate 12. The actuator 44may be configured engage the gear teeth 42 on the outer ring plate 38via one or more gears 46 to rotate the outer ring plate 38 relative tothe base plate 12 such that the posts 40 engage each protrusion 36 torotate the first portions 20 of each fixture 18 about each respectiveyaw axis 22 to adjust each respective yaw angle, ψ, that each lightsource 34 directs light relative to the center 19 or relative to thecentral opening 14 of the base plate 12. Guide blocks 49 may be securedto the base plate 12. The guide blocks 49 may define external slots anda radially inward portion of the outer ring plate 38 may be partiallydisposed within the external slots defined by the guide blocks 49. Theouter ring plate 38 may be configured to slide within the external slotsdefined by the guide blocks 49 when the outer ring plate 38 is rotatedabout the center 19 of the base plate 12.

The first portion 20 of each fixture 18 may define one of a plurality ofthrough holes 48. The drive mechanism may include a plurality of posts50. Each post 50 extends upward through one of the through holes 48 andengages one of the second portions 28 of one of the fixtures 18. Theplurality of posts 50 are configured to translate upward or downward torotate the second portions 28 of each fixture 18 about each respectivepitch axis 30 to adjust each respective pitch angle, θ, at which eachlight source 34 directs light away from the base plate 12 relative tothe outer or upper surface 26 of the base plate 12.

The drive mechanism may include a lower plate 52 that is disposed belowthe base plate 12. Each post 50 may be secured to a lower plate 52. Thelower plate 52 may be connected to one or more actuators 54, such aslinear servo motors, that are configured to adjust a vertical positionof the lower plate 52 to translate each of the plurality of posts 50upward or downward. The one or more actuators 54 may be secured to thebase plate 12 such that activating the one or more actuators 54 producesrelative movement between the base plate 12 and the lower plate 52. Thesecond portion 28 of each fixture 18 may also include a biasing element56 that biases the second portion 28 of each fixture into engagementwith one of the plurality of posts 50. The biasing element 56 of eachfixture 18 is also configured adjust the position of the second portion28 of each fixture 18 upon retraction (i.e., the lowering) of the posts50 such that the pitch angles, θ, at which each light source 34 directslight away from the base plate 12 relative to the outer or upper surface26 of the base plate 12 decreases.

It should be understood that the drive mechanism described herein isjust an example. Any other system that is configured to transfer powerfrom an actuator to the fixtures 18 to adjust the positions of the firstportions 20 and the second portions 28 of each fixture 18 in order toadjust the yaw angles, ψ, and the pitch angles, θ, at which each of thelight sources 34 are directed should be construed as disclosed herein.Such systems that are configured to transfer power may include gears,linking arms, shafts, etc. For example, small actuators, such electricmotors may be directly connected to the first and second pivot shafts toadjust the yaw angles, ψ, and the pitch angles, θ, respectively. Asanother example, each of the first portions 20 of each fixture 28 mayinclude gear teeth that engage a ring gear or a chain that is connectedto an actuator, such as an electric motor, to adjust the yaw angles, ψ.

Referring now to FIG. 3, the inspection system 10 may include aconveying system that is configured to transport manufactured productsor components 60 into a station that includes the inspection system 10.The manufactured products or components 60 may be secured in place by achuck 62 or some other device that secures the position of themanufactured products or components 60 within the station.

Alternatively, the manufactured products or components 60 may simplyremain on the conveying system, such as a conveyor belt or within achute of a gravity fed system, while the manufactured products orcomponents 60 are in the station that includes the inspection system 10.If utilizing a conveying system, the components of the conveying systemmay be transparent so that the light sources 34 may direct light ontothe manufactured products or components 60 during an inspection. Suchtransparent components may be the conveyor itself or a flat surface thatthe manufactured products or components may rest upon during theinspection. Alternatively, the light sources 34 may be disposed abovethe manufactured products or components 60 if they are transported intoa station that includes the inspection system 10 (i.e., the viewillustrated in FIG. 3 may be turned upside down).

The inspection system 10 may include one or more cameras 64 that areconfigured to record images of the manufactured products or components60 during an inspection of the manufactured products or components 60.The light sources 34, the cameras 64, the actuators 44, 54, and anyother component that is part of the inspection system 10 may beconnected to a power source (e.g., a local power grid) and to acontroller. The controller may include control logic or an algorithmthat is configured to detect defects (described above) in themanufactured products or components 60 being inspected. The controllogic or an algorithm may also be configured to operate the actuators44, 54 to adjust the to adjust the yaw angles, ψ, and the pitch angles,θ, over a range during the inspection to ensure that any defects in themanufactured products or components 60 are illuminated during theinspection process. The control logic or algorithm may then make adetermination if any detected defects are within a tolerable range. Ifany detected defects are within a tolerable range, the manufacturedproducts or components 60 may be passed for consumer use. If anydetected defects are not within a tolerable range, the manufacturedproducts or components 60 may be transported to a rejected productstorage bin.

Defect detection may be conducted by running several image processingalgorithms within the controller and then analyzing the resultant pixelbrightness values. Groups of pixels whose brightness values exceed apreset threshold are flagged as a “bright defect,” while groups ofpixels whose brightness values lie below a preset threshold are flaggedas a “dark defect.” Different image processing techniques and thresholdvalues are often needed to inspect for bright and dark defects on themanufactured products or components or within a region of themanufactured products or components. Such imaging techniques to detectdefects on manufactured products or components are disclosed in U.S.Pat. No. 9,575,013, the disclosure of which is hereby incorporated inits entirety by reference herein.

The controller may include a microprocessor or central processing unit(CPU) in communication with various types of computer readable storagedevices or media. Computer readable storage devices or media may includevolatile and nonvolatile storage in read-only memory (ROM),random-access memory (RAM), and keep-alive memory (KAM), for example.KAM is a persistent or non-volatile memory that may be used to storevarious operating variables while the CPU is powered down.Computer-readable storage devices or media may be implemented using anyof a number of known memory devices such as PROMs (programmableread-only memory), EPROMs (electrically PROM), EEPROMs (electricallyerasable PROM), flash memory, or any other electric, magnetic, optical,or combination memory devices capable of storing data, some of whichrepresent executable instructions, used by the controller in controllingthe inspection system 10.

Referring to FIG. 7, an isometric view of one of the fixtures 18illustrating a wiring system that may be utilized by the inspectionsystem 10 to connect each of the light sources 34 to the power source(e.g., a local power grid) and the controller. The base plate 12 maydefine a plurality of orifices 66. More specifically, the plurality oforifices 66 may be defined by a plurality of posts 68 that protrudeupward from the base plate 12. One of a plurality of flexible circuitboards 70 may be configured to connect each light source or any otherelectrical device (e.g., a sensor or camera) to the power source and/orto the controller.

Referring to FIG. 8, an isometric view of an alternative embodiment ofthe inspection system 10′ for manufactured products or components isillustrated. Unless otherwise described herein, the alternativeembodiment of the inspection system 10′ should be construed to includeall of the components and functionality of the inspection system 10described above in FIGS. 1-7. The differences between the alternativeembodiment of the inspection system 10′ and inspection system 10 is thatthe cameras 64 have been disposed on one or more of the fixtures 18.More specifically, the cameras 64 have been disposed on the secondportions 28 of one or more of the fixtures 18.

The cameras may be secured to two or more of the fixtures 18 and may beequally spaced apart radially relative to the base plate 12. In theembodiment depicted in FIG. 8, a camera 64 is disposed on every otherfixture 18 while a light source 34 is disposed on every other fixture.Under such a configuration the array of fixtures 18 may be referred toas first and second arrays of interleaved fixtures where a light source34 is secured to each fixture of the first array of fixtures and acamera 64 is secured to each fixture of the second array of fixtures.Each light source 34 may be directed and each camera 64 may be focusedtoward a position of the manufactured product or component, similar towhat is depicted in FIG. 3. The drive mechanism is configured to adjustthe yaw angles, ψ, and the pitch angles, θ, at which both the lightsources 34 and the cameras 64 are directed relative to the center 19 ofthe base plate 12 and the outer surface 26 of the base plate 12,respectively, during an inspection of a manufactured product orcomponent.

The alternative embodiment of the inspection system 10′ may also beconnected to a power source and a controller. The alternative embodimentof the inspection system 10′ may be configured to detect defects duringan inspection in a similar manner as described above with respect toinspection system 10. The control logic or an algorithm may also beconfigured to operate the actuators 44, 54 to adjust the to adjust theyaw angles, ψ, and the pitch angles, θ, of both the light sources 34 andthe cameras 64 over a range during the inspection to ensure that anydefects in the manufactured products or components are illuminated andto ensure the cameras 64 are oriented over a range of angles to detectany defects during the inspection process.

Alternatively, sensors that include both a light source (or emitter) anda receiver may be secured to the fixtures 18 and may be configured toperform a sweep over a range of yaw angles, v, and pitch angles, θ,during the inspection process to ensure that any defects in themanufactured products or components are detected. Such types of sensorsthat include a light source (or emitter) and a receiver may usetriangulation to detect surface features and any defects in the surfacefeatures of manufactured products or components. Such types of sensorsthat include a light source (or emitter) and a receiver that may usetriangulation to detect surface features and any defects in the surfacefeatures are disclosed in U.S. Pat. No. 9,575,013, the disclosure ofwhich is hereby incorporated in its entirety by reference herein.

It should be understood that the designations of first, second, third,fourth, etc. for any components, states, or conditions described hereinmay be rearranged in the claims so that they are in chronological orderwith respect to the claims.

The words used in the specification are words of description rather thanlimitation, and it is understood that various changes may be madewithout departing from the spirit and scope of the disclosure. Aspreviously described, the features of various embodiments may becombined to form further embodiments that may not be explicitlydescribed or illustrated. While various embodiments could have beendescribed as providing advantages or being preferred over otherembodiments or prior art implementations with respect to one or moredesired characteristics, those of ordinary skill in the art recognizethat one or more features or characteristics may be compromised toachieve desired overall system attributes, which depend on the specificapplication and implementation. As such, embodiments described as lessdesirable than other embodiments or prior art implementations withrespect to one or more characteristics are not outside the scope of thedisclosure and may be desirable for particular applications.

What is claimed is:
 1. An inspection system comprising: a base plate; anarray of fixtures arranged radially about a center of the base plate,each fixture having a first portion rotatably secured to the base plateand configured to rotate about a yaw axis and a second portion rotatablysecured to the first portion and configured to rotate about a pitchaxis; a plurality of light sources, each light source secured to one ofthe fixtures in the array of fixtures and configured to direct light ata yaw angle about the yaw axis of the respective fixture relative to thecenter of the base plate and away from the base plate at a pitch angleabout the pitch axis of the respective fixture relative to an outersurface of the base plate; and a drive mechanism configured to, rotatethe first portions of each fixture about each respective yaw axis toadjust the yaw angle at which each light source directs light relativeto the center of the base plate, and rotate the second portions of eachfixture about each respective pitch axis to adjust the pitch angle atwhich each light source directs light away from the base plate relativeto the outer surface of the base plate.
 2. The inspection system ofclaim 1, wherein the first portion of each fixture includes a protrusionthat extends outward from the base plate, and wherein the drivemechanism is configured to engage the protrusion of each fixture torotate the first portions of each fixture about each respective yaw axisto adjust each respective yaw angle.
 3. The inspection system of claim2, wherein the drive mechanism includes an outer ring plate that isdisposed about the base plate, the outer ring plate having outwardlyextending posts that are configured to engage each protrusion to rotatethe first portions of each fixture about each respective yaw axis uponrotation of the outer ring plate.
 4. The inspection system of claim 3further comprising an actuator, and wherein the outer ring plateincludes gear teeth and the actuator is configured engage the gear teethvia one or more gears to rotate the outer ring plate relative to thebase plate.
 5. The inspection system of claim 1, wherein the firstportion of each fixture defines one of a plurality of through holes andthe drive mechanism includes a plurality of posts, each post extendingupward through one of the through holes and engaging one of the secondportions of one of the fixtures, and wherein the plurality of posts areconfigured to translate upward or downward to rotate the second portionsof each fixture about each respective pitch axis to adjust eachrespective pitch angle.
 6. The inspection system of claim 5, wherein thedrive mechanism includes a lower plate that is disposed below the baseplate and each of the plurality of posts are secured to the lower plate.7. The inspection system of claim 6 further comprising an actuator, andwherein the actuator is configured to adjust a vertical position of thelower plate to simultaneously translate each of the plurality of postsupward or downward.
 8. The inspection system of claim 5, wherein thesecond portion of each fixture includes a biasing element that biaseseach second portion into engagement with one of the plurality of posts.9. An inspection system for manufactured components comprising: aring-shaped base plate defining a central opening and defining aplurality of orifices arranged radially about the central opening; anarray of fixtures, each fixture having a lower portion and an upperportion, the lower portion of each fixture having a first pivot shaftdisposed within one orifice of the plurality of orifices such that thelower portion of each fixture is configured to rotate about a yaw axis,the upper portion of each fixture rotatably secured to the lower portionvia a second pivot shaft such that the lower portion rotates about apitch axis; a plurality of light sources, each light source secured toone of the fixtures and configured to direct light at a yaw angle aboutthe yaw axis of the respective fixture relative to the central openingand away from the ring-shaped base plate at a pitch angle about thepitch axis of the respective fixture relative to an upper surface of thering-shaped base plate; and a drive mechanism configured to, rotate thelower portions of each fixture about each respective yaw axis to adjustthe yaw angle at which each light source directs light relative to thecentral opening, and rotate the upper portions of each fixture abouteach respective pitch axis to adjust the pitch angle at which each lightsource directs light away from the ring-shaped base plate relative tothe upper surface of the ring-shaped base plate.
 10. The inspectionsystem of claim 9, wherein the lower portion of each fixture includes aprotrusion that extends outward from the base plate, and wherein thedrive mechanism is configured to engage the protrusion of each fixtureto rotate the lower portions of each fixture about each respective yawaxis to adjust each respective yaw angle.
 11. The inspection system ofclaim 10, wherein the drive mechanism includes an outer ring plate thatis disposed about the ring-shaped base plate, the outer ring platehaving upwardly extending posts that are configured to engage eachprotrusion to rotate the lower portions of each fixture about eachrespective yaw axis upon rotation of the outer ring plate.
 12. Theinspection system of claim 11 further comprising an actuator, andwherein the outer ring plate includes gear teeth and the actuator isconfigured to engage the gear teeth via one or more gears to rotate theouter ring plate relative to the ring-shaped base plate.
 13. Theinspection system of claim 9, wherein the lower portion of each fixturedefines one of a plurality of through holes and the drive mechanismincludes a plurality of posts, each post extending upward through one ofthe through holes and engaging one of the upper portions of one of thefixtures, and wherein the plurality of posts are configured to translateupward or downward to rotate the upper portions of each fixture abouteach respective pitch axis to adjust each respective pitch angle. 14.The inspection system of claim 13, wherein the drive mechanism includesa lower plate that is disposed below the base plate and each of theplurality of posts are secured to the lower plate.
 15. The inspectionsystem of claim 14 further comprising an actuator, and wherein, whereinthe actuator is configured to adjust a position of the lower platetowards or away from the ring-shaped base plate to simultaneouslytranslate each of the plurality of posts upward or downward.
 16. Theinspection system of claim 13, wherein the upper portion of each fixtureincludes a biasing element that biases each upper portion intoengagement with one of the plurality of posts.
 17. An inspection systemfor manufactured components comprising: a base plate; first and secondarrays of fixtures interleaved relative to each other and arrangedradially about a center of the base plate, each fixture of the first andsecond arrays having a first portion rotatably secured to the base plateand configured to rotate about a yaw axis and a second portion rotatablysecured to the first portion and configured to rotate about a pitchaxis; a plurality of light sources, each light source secured to one ofthe fixtures of the first array of fixtures and configured to directlight at a first yaw angle about the yaw axis of the respective fixturerelative to the center of the base plate and away from the base plate ata first pitch angle about the pitch axis of the respective fixturerelative to an outer surface of the base plate; a plurality of cameras,each camera secured to one of the fixtures of the second array offixtures and directed at a second yaw angle about the yaw axis of therespective fixture relative to the center of the base plate and awayfrom the base plate at a second pitch angle about the pitch axis of therespective fixture relative to the outer surface of the base plate; anda drive mechanism configured to, rotate the first portions of eachfixture of the first array of fixtures about each respective yaw axis toadjust the first yaw angle at which each light source directs lightrelative to the center of the base plate, rotate the second portions ofeach fixture of the first array of fixtures about each respective pitchaxis to adjust the first pitch angle at which each light source directslight away from the base plate relative to the outer surface of the baseplate, rotate the first portions of each fixture of the second array offixtures about each respective yaw axis to adjust the second yaw angleat which each camera is directed relative to the center of the baseplate, and rotate the second portions of each fixture of the secondarray of fixtures about each respective pitch axis to adjust the secondpitch angle at which each camera is directed away from the base platerelative to the outer surface of the base plate.
 18. The inspectionsystem of claim 17, wherein the first portion of each fixture of thefirst and second array of fixtures includes a protrusion that extendsoutward from the base plate, and wherein the drive mechanism includes anouter ring plate that is disposed about the base plate, the outer ringplate having upwardly extending posts that are configured to engage eachprotrusion to rotate the first portions of each fixture about eachrespective yaw axis upon rotation of the outer ring plate.
 19. Theinspection system of claim 17, wherein the first portion of each fixturedefines one of a plurality of through holes and the drive mechanismincludes a plurality of posts, each post extending upward through one ofthe through holes and engaging one of the second portions of one of thefixtures, and wherein the plurality of posts are configured to translateupward or downward to rotate the second portions of each fixture abouteach respective pitch axis.
 20. The inspection system of claim 19,wherein the drive mechanism includes a lower plate that is disposedbelow the base plate and each of the plurality of posts are secured tothe lower plate.